Recent papers:

1. “On Silicon-Based Speed Path Identification” Leonard Lee, Li-C. Wang, Praveen Parvathala, T M Mak VLSI Test Symposium, 20044 Proceedings. 23nd IEEE 1-4 May 2005 Page(s): 35-41

2. “On A Software-Based Self-Test Methodology and Its Application” Charles H-P Wen, Li-C. Wang, Kwang-Ting Cheng, Kai Yang , Wei-Ting Liu , Ji-Jan Chen, VLSI Test Symposium, 20044 Proceedings. 23nd IEEE 1-4 May 2005 Page(s): 107-113

3. “Reducing Pattern Delay Variations for Screening Frequency-Dependent Defects” Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir  VLSI Test Symposium, 20044 Proceedings. 23nd IEEE., 1-4 May 2005 Page(s): 153-159

Courses: (these sites are password protected because they contains PDF files for papers and presentations to be downloaded by students, which might be copy-right protected. Hence, these sites cannot be made to public access)

• ece156A (Fall, 2005)

• ece156B (Winter, 2005)