
Li-C. Wang
Associate Professor
Department of ECE
University of California
Santa Barbara, CA 93106-9560
Room 3161, Eng I.
Tel: 805-893-5916
Cell: 805-886-6017
licwang@ece.ucsb.edu
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Biography
Ph.D., Department of ECE, University of
Texas at Austin, 1996
MSCS, Department of Computer
Sciences, University of Texas at Austin, 1991
 Research
Interests
Statistical methods for test and diagnosis
Microprocessor Test and Verification
Data
mining and learning algorithms for test and verification applications
Design and test optimization

Prior Academic & Industry Experiences
Assistant Professor, Computer
Engineering Group, Department of ECE,
University of California -
Santa Barbara, California, Spring 2001-
Spring 2004.
Assistant
Professor, Computer Engineering Group,
Department of EE, Texas A&M
University,
College Station, Texas, Spring 1999 - Fall 2000.
CAD Research Consultant, Test and Verification, PowerPC Design Team,
Motorola, Austin, Texas,
1/1/1999 - 12/31/2000.
CAD Research & Development, Test & Verification - Tools and
Methodologies, Somerset PowerPC
Design Center, Motorola, Austin, Texas, March 1996- Dec 1998.
Member of Technical Staff, Mathematics Research Center,
AT&T Bell Labs, Murray
Hill, NJ, 1991-1995 summers

Honors & Awards
Best Panel Award, IEEE VLSI Test Symposium (VTS),
2003
Best
Paper Award, Design Automation and Test Conference in Europe, 2003
Best Paper Award, IEEE VLSI Test Symposium (VTS),
1999
Best Paper Award, Design Automation and Test Conference in
Europe, 1998
Motorola Silver Quill Award
SRC
Graduate Fellowship, 1993-1996
 Professional
Services
Program Chair and co-founder,
IEEE
Microprocessor Test and Verification Workshop (MTV)
Steering Committee,
IEEE
Test SynthesisWorkshop (ITSW) and IEEE Test Economic Workshop
Program Committee, IEEE VLSI Test
Symposium 03-05,
IEEE High-level Test and Validation Workshop
(HLDVT),
International
Conference on Computer Design (ICCD),
Asian Test Symposium
(ATS04, 05)
Track Chair, Test and Verification
Track,
IEEE International Symposium on Quality of Electronic Design (ISQED04,
05, 06)
Guest Editor, IEEE Design
and Test of Computer (D&T),
Special issue on speed binning and special issue on functional
verification
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